Manufacturing process monitoring
Monitor feature-by-time or station-by-feature signatures without flattening away structure.
Applications
Tensor SPC is most useful when process data have meaningful modes: variables, time, locations, stages, product families, or operating conditions.
Monitor feature-by-time or station-by-feature signatures without flattening away structure.
Apply structure-aware monitoring to production tests, time-series signatures, inspection measurements, and multivariate operating patterns.
Use residual maps and structured statistics to support anomaly detection, containment, and data-informed investigation.
Good candidate data
Residual maps can help identify where a structured observation differs from the learned model.